We expose the “last line effect,” the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.
x += o t h e r . x ;
y += o t h e r . y ;
z += o t h e r . y ;
http://www.st.ewi.tudelft.nl/~mbeller/publications/2015_beller_zaidman_karpov_the_last_line_effect_preprint.pdf
