Tuesday, March 24, 2015

Last line effect

We expose the “last line effect,” the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

x += o t h e r . x ;
y += o t h e r . y ;
z += o t h e r . y ;